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Basic Studies In Radiation Effects On Materials. Part II. Ionic Fragmentation Of Molecules By X-Rays And Secondary Electron Spectra From Bombardment Of Gas With Electrons

Report Number: ASD TDR 62-10 Part 2
Author(s): Johnston, W.H.; Vestal, M.
Corporate Author: Johnston (William H) Labs Inc Baltimore Md
Laboratory: Directorate of Materials and Processes
Date of Publication: 1962-07
Pages: 77
Contract: AF 33(616)-7678
Project: 7360
Task: 736003
AD Number: AD0285564

The effects of radiation on any material depends on the physics of the primary interaction with the material and the complex chemistry initiated. The combination of a coincidence mass spectrometer (patented) and a special x-ray tube has made possible direct measurements of the ion fragmentation patterns produced by x-ray impact on simple gas phase molecules. Mass spectra are reported for nitrous oxide, and for propane under bombardment by low energy x-rays. For comparison purposes, spectra were also obtained of these materials under bombardment by 1200 ev primary electrons. Measurements were made of the secondary electron energy distributions for a number of molecules of importance in radiation chemistry, at a fixed angle, using primary ionizing electrons in the energy range of 100 to 1000 ev. Measurement of the electron energy spectrum is accomplished in the coincidence mass spectrometer. Theoretical interpretation of the data in terms of radiation chemical effects is included. The design, construction, and operation of the instrumentation are described.

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