Contrails
The goal of the Contrails project is to help preserve and disseminate the technical record of 20th century aerospace research, highlighting in particular the research endeavors of the Illinois Tech community.

Role of X-Ray Intensities on Crystal Perfection Studies

Report Number: AF AFOSR-62-71
Author(s): Azaroff, L. V.
Corporate Author: Illinois Inst. of Tech.
Corporate Report Number: AFOSR-J1127
Date of Publication: 1963
Pages: 16
Original AD Number: AD 421715

Abstract:
Present x-ray diffraction theory is based on an artificial "mosaic" crystal proposed by Darwin. In terms of this model, crystal perfection can be related to the intensity of an x-ray reflection via two factors called primary and secondary extinction. It is possible to evaluate these two terms independently either by comparing the reflecting powers of a single reflection at different x-ray wavelengths or by comparing several hkl reflections using the same wavelength. This analysis yields an effective thickness for the "mosaic" blocks and an average value for their relative tilts. It is then possible to interpret Darwin's model of a crystal in terms of dislocation theory. Relatively large concentrations of point defects in a crystal modify its electron density distribution sufficiently to affect the x-ray intensities. If the intensities are measured accurately and are suitably processed, they can be used to synthesize "difference" electron densities capable of disclosing the imperfections present. Both of the above procedures have been used successfully and are illustrated by applications to silicon and zinc oxide crystals. The possible limitations of electron density
methods are illustrated by a study of indium antimonide.

This citation is provided as a resource for researchers, but Contrails cannot provide a full-image download

U.S. government employees, Military/Department of Defense employees, and U.S. government contractors and sub-contractors may be eligible to register with the Defense Technical Information Center (DTIC), where this report and others like it may be available

Other options for obtaining this report

Via the Defense Technical Information Center (DTIC):
This report is not publicly available via DTIC

Via National Technical Information Service:
This report is unlikely to be available in the National Technical Reports Library

Indications of Public Availability
No digitial image of an index entry indicating public availability is currently available
There has been no verification of an indication of public availability from an inside cover statement
Tags: